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| A range of industries, including general scientific and materials research, optoelectronics, and data storage, require profilometry measurements of surface topography to either control their processes or research new material characteristics. Typical surface measurement parameters which we address include surface flatness, roughness, curvature, peak-to-valley, asperity, waviness, texture, volume, sphericity, slope, density, stress, bearing ratio, and distance mainly in the micron to nanometer range. |
Surface Profilometry and Metrology
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Stylus Profiling |
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Alpha-Step D-Series
Topography of surfaces
with outstanding
performance and value
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Alpha-Step IQ
Benchtop stylus profilometry
for research applications
or pilot lines |
P-Series
Benchtop stylus profilometry
for production applications |
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| Optical Profiling |
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MicroXAM - 100
3D topography analysis
of a variety of surfaces
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