New products - new opportunities

Using five distinct technologies for making measurements, ADE® Corporation's products are expanding our customer's ability to develop and maintain the newest techniques used in the search for faster, smaller, lower power technology.

Semiconductor technology

Film Inspection Tool

High speed, fully automated surface inspection and micro-defect detection system for unpatterned 300mm wafers with blanket films.

WaferSight

Measures quality of flatness and thickness of bare semiconductor wafers, after polishing. High precision enables lower cost of ownership. High throughput and high resolution mapping based on ADE's proprietary optical laser interferometry, supporting the next several IC generations.

NanoXam

New copper process metrology tool for patterned wafers. Measuring copper chemical-mechanical-polishing surface structure, NanoXam is the only product on the market that performs non-contact 3D surface mapping to improve process and statistically monitor the polishing process.

FabVision

The first yield and quality data analysis system to collect, store, analyze and retrieve inspection and metrology data collected by semiconductor wafer manufacturers.

Magnetics

X9

An award-winning computer-controlled measurement system capable of fully characterizing thin film magnetic head material.

V300

Magnetic Wafer Mapping System rapidly and automatically creates a map of the magnetic properties of wafers used to fabricate advanced heads or MRAM wafers..

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