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KLA-Tencor’s comprehensive portfolio of defect inspection and metrology products helps leading-edge integrated circuit manufacturers manage yield throughout the entire fabrication process—from research and development to final volume production. These products and solutions are designed to help fabs accelerate their development and production ramp cycles, to achieve higher and more stable semiconductor die yields and to improve overall profitability. Our products are also used in a number of related industries, including wafer manufacturing, mask manufacturing, solar process development and control, medical device manufacturing, light emitting diode (LED) and data storage manufacturing, and general materials research. Product Portfolio BrochureEnglish, 2.35 MB Need help opening a pdf? |
Related Products
- 2367
- 281x Series (2810 and 2815)
- 95i/97i
- Aleris™ 8310
- Aleris™ 8350
- Aleris™ 8500
- Alpha-Step IQ
- Archer 100
- Archer 200
- Archer AIM+
- Archer XT+
- ASET-F5x
- Automated Mask Defect Disposition System (AMDD)
- Candela CS10
- Candela CS20
- Candela™ 6120
- Candela™ 6300Series
- Candela™ 7100
- CuSeal
- eDR-5200
- eS31
- eS32
- eS35
- FabVision
- HRP-250
- HRP-350
- iDO
- K-T Analyzer
- KerrMapper™ VS300
- Klarity ACE XP
- Klarity Bitmap
- Klarity Defect
- Klarity SSA
- LithoWare
- LithoWare 2.0
- LMS IPRO4
- LWM9045
- MicroLoop
- MicroXAM
- MPX
- OptiFLAT III
- P-16+
- P-6
- PlasmaTemp™
- PlasmaVolt™ X2
- Polar Kerr
- ProBEAM
- Process Window Qualification (PWQ)
- ProDATA
- PROLITH
- Puma 91xx Series
- Quantox XP
- RS-100
- RS-200
- SpectraCD-XT
- SpectraCD™ 100
- SpectraCD™ 200
- SpectraFx 100
- SpectraFx 200
- SURFmonitor
- Surfscan SP1 DLS
- Surfscan SP2
- Surfscan SP2 XP
- TeraFab Q-3X
- TeraFab SLQ-1X
- TeraFab SLQ-2X
- TeraScan
- TeraScanHR
- TeraStar
- Therma-Probe 630 XP
- VisEdge CV300-R
- WaferSight 2
Product Portfolio Brochure